Peter W. Hawkes,
Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France) Hawkes
Advances in Imaging and Electron Physics
Gebonden Engels 2015 9780128023808Levertijd ongeveer 9 werkdagen
Gratis verzonden
Samenvatting
Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Specificaties
ISBN13:9780128023808
Taal:Engels
Bindwijze:Gebonden
Aantal pagina's:260
Uitgever:Elsevier Science
Hoofdrubriek:Wetenschap en techniek, Computer en informatica
Lezersrecensies
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Inhoudsopgave
- CISCEM 2014 Niels de Jonge
- Progress and Development of Direct Detectors for Cryo-Electron MicroscopyA. R. Faruqi, Richard Henderson, and Greg McMullan
- Electron Optics and Electron Microscopy Conference Proceedings and Abstracts: A Supplement Peter W. Hawkes
- Scanning Thermal Microscopy (SThM): How to Map Temperature and Thermal Properties at the NanoscaleGrzegorz Wielgoszewski and Teodor Gotszalk
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