Advances in Imaging and Electron Physics

Gebonden Engels 2017 9780128120866
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Samenvatting

Advances in Imaging and Electron Physics, Volume 204, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

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Inhoudsopgave

1. New physical principle for interference of light and material particles
Roman Castaneda and Giorgio Matteucci
2. A Review of Scanning Electron Microscopy in Near Field Emission Mode
Taryl L. Kirk
3. Nonscalar Mathematical Morphology
Jasper van de Gronde and Jos B.T.M. Roerdink
4. Energy Analysing and Energy Selecting Electron Microscopes
A.J.F. Metherel

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€ 219,75
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          Advances in Imaging and Electron Physics