Samenvatting

Principles of Electron Optics: Applied Geometrical Optics, Second Edition gives detailed information about the many optical elements that use the theory presented in Volume 1: electrostatic and magnetic lenses, quadrupoles, cathode-lens-based instruments including the new ultrafast microscopes, low-energy-electron microscopes and photoemission electron microscopes and the mirrors found in their systems, Wien filters and deflectors. The chapter on aberration correction is largely new. The long section on electron guns describes recent theories and covers multi-column systems and carbon nanotube emitters. Monochromators are included in the section on curved-axis systems.

The lists of references include many articles that will enable the reader to go deeper into the subjects discussed in the text.

The book is intended for postgraduate students and teachers in physics and electron optics, as well as researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy and nanolithography.

Specificaties

ISBN13:9780128133699
Taal:Engels
Bindwijze:Paperback

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Inhoudsopgave

PART VII – INSTRUMENTAL OPTICS
35. Electrostatic Lenses 
36. Magnetic Lenses 
37. Electron Mirrors, Low-energy-electron Microscopes and Photoemission Electron Microscopes, Cathode Lenses and Field-emisssion Microscopy 
38. The Wien Filter 
39. Quadrupole Lenses 
40. Deflection Systems 

PART VIII – ABERRATION CORRECTION AND BEAM INTENSITY DISTRIBUTION (CAUSTICS)
41. Aberration Correction 
42. Caustics and their Applications 

PART IX – ELECTRON GUNS
43. General Features of Electron Guns 
44. Theory of Electron Emission 
45. Pointed Cathodes without Space Charge 
46. Space Charge Effects 
47. Brightness 
48. Emittance 
49. Gun optics 
50. Complete Electron Guns 

PART X – SYSTEMS WITH A CURVED OPTIC AXIS
51. General Curvilinear Systems 
52. Magnetic Sector Fields 
53. Unified Theories of Ion Optical Systems

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          Principles of Electron Optics, Volume 2