Martin Hÿtch,
Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France) Hawkes,
Peter W. Hawkes
Morphological Image Operators
Gebonden Engels 2020 9780128210031Levertijd ongeveer 9 werkdagen
Gratis verzonden
Samenvatting
Advances in Imaging and Electron Physics, Volume 216, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
Specificaties
ISBN13:9780128210031
Taal:Engels
Bindwijze:Gebonden
Aantal pagina's:520
Uitgever:Elsevier Science
Hoofdrubriek:Wetenschap en techniek, Computer en informatica
Lezersrecensies
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Inhoudsopgave
1. First principles
Henk J.A.M. Heijmans
2. Complete lattices
Henk J.A.M. Heijmans
3. Operators on complete lattices
Henk J.A.M. Heijmans
4. Operators which are translation invariant
Henk J.A.M. Heijmans
5. Adjunctions, dilations, and erosions
Henk J.A.M. Heijmans
6. Openings and closings
Henk J.A.M. Heijmans
7. Hit-or-miss topology and semi-continuity
Henk J.A.M. Heijmans
8. Discretization
Henk J.A.M. Heijmans
9. Convexity, distance, and connectivity
Henk J.A.M. Heijmans
10. Lattice representations of functions
Henk J.A.M. Heijmans
11. Morphology for grey-scale images
Henk J.A.M. Heijmans
12. Morphological filters
Henk J.A.M. Heijmans
13. Filtering and iteration
Henk J.A.M. Heijmans
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