Martin Hÿtch,
Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France) Hawkes,
Peter W. Hawkes
Advances in Imaging and Electron Physics
Gebonden Engels 2021 9780128246122Levertijd ongeveer 9 werkdagen
Gratis verzonden
Samenvatting
Advances in Imaging and Electron Physics, Volume 219, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
Specificaties
ISBN13:9780128246122
Taal:Engels
Bindwijze:Gebonden
Aantal pagina's:340
Uitgever:Elsevier Science
Hoofdrubriek:Wetenschap en techniek, Computer en informatica
Lezersrecensies
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Inhoudsopgave
Preface
Martin Hÿtch and Peter W. Hawkes
1. Introduction to strain characterization method in transmission electron microscopy
Alexandre Pofelski︎
2. Moiré sampling in scanning transmission electron microscopy
Alexandre Pofelski︎
3. Scanning transmission electron microscopy moiré sampling geometrical phase analysis (STEM moiré GPA)
Alexandre Pofelski︎
4. Performance of scanning transmission electron microscopy moiré sampling geometrical phase analysis
Alexandre Pofelski︎
5. Applications of scanning transmission electron microscopy moiré sampling geometrical phase analysis
Alexandre Pofelski︎
6. Quasi-analytical modelling of charged particle ensembles in neutral gas flow and electric fields
Mikhail Monastyrskiy, Roman Ablizen, Anatoly Neishtadt, Alexander Makarov, and Mikhail
7. Superconducting electron lenses
David Hardy
8. Lorentz microscopy or electron phase microscopy of magnetic objects
Richard Harry Wade
Martin Hÿtch and Peter W. Hawkes
1. Introduction to strain characterization method in transmission electron microscopy
Alexandre Pofelski︎
2. Moiré sampling in scanning transmission electron microscopy
Alexandre Pofelski︎
3. Scanning transmission electron microscopy moiré sampling geometrical phase analysis (STEM moiré GPA)
Alexandre Pofelski︎
4. Performance of scanning transmission electron microscopy moiré sampling geometrical phase analysis
Alexandre Pofelski︎
5. Applications of scanning transmission electron microscopy moiré sampling geometrical phase analysis
Alexandre Pofelski︎
6. Quasi-analytical modelling of charged particle ensembles in neutral gas flow and electric fields
Mikhail Monastyrskiy, Roman Ablizen, Anatoly Neishtadt, Alexander Makarov, and Mikhail
7. Superconducting electron lenses
David Hardy
8. Lorentz microscopy or electron phase microscopy of magnetic objects
Richard Harry Wade
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