M. K. (Metals and Ceramics Division, Metals and Ceramics Division, Oak Ridge National Laboratory, USA) Miller
Meer over de auteurs
M. K. (Metals and Ceramics Division, Metals and Ceramics Division, Oak Ridge National Laboratory, USA) Miller,
,
A. (Department of Materials, Department of Materials, University of Oxford) Cerezo,
M. G. Hetherington,
G. D. W. (Professor Of Materials Science, Department of Materials, Professor Of Materials Science, Department of Materials, University of Oxford) Smith FRS,
G. D. W. Smith FRS
e.a.
Atom Probe Field Ion Microscopy
Gebonden Engels 1996 9780198513872Levertijd ongeveer 11 werkdagen
Gratis verzonden
Samenvatting
This book provides a definitive account of the theory, practice and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. Recent advances in the method,which are largely due to the present authors, now permit the atomic-scale chemistry of a solid specimen to be recognised in three dimensions. As a result of these developments, new and exciting applications are rapidly emerging in the field of material science, surface science, and catalysis. The book is a state-of-the art account of this important field, and is intended for a graduate-level readership.
Specificaties
ISBN13:9780198513872
Taal:Engels
Bindwijze:Gebonden
Aantal pagina's:520
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