M. (University of Connecticut Aindow,
M. Aindow,
C. J. (Department of Engineering Kiely,
C. J. Kiely
e.a.
Electron Microscopy and Analysis 2001
Gebonden Engels 2001 9780750308120Levertijd ± 10 werkdagen
Gratis verzonden
Samenvatting
Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Electron Microscopy and Analysis 2001 presents a useful snapshot of the latest developments in instrumentation, analysis techniques, and applications of electron and scanning probe microscopies. The book is ideal for materials scientists, solid state physicists and chemists, and researchers in these areas who want to keep abreast of the state of the art in the field.
Specificaties
ISBN13:9780750308120
Taal:Engels
Bindwijze:Gebonden
Aantal pagina's:529
Uitgever:Taylor & Francis Ltd
Lezersrecensies
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Inhoudsopgave
Preface Plenary Lectures HREM and Electron Crystallography Advanced SEM and Surface Science New Instrumentation, Imaging, and Analysis Ferrous Metals and Intermetallics Advanced Microanalysis and Elemental Imaging Carbons, Ceramics, and Composites Microscopy of Interfaces and Surfaces Catalysts, Sensors, and Environmental Materials Semiconductors, Superconductors, and Magnetic Materials Scanning Probe Microscopy Author Index Subject Index
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