Peter J. Goodhew,
John Humphreys,
Richard Beanland
Electron Microscopy and Analysis
Gebonden Engels 2017 3e druk 9781138441538Levertijd ± 11 werkdagen
Gratis verzonden
Samenvatting
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.
Specificaties
ISBN13:9781138441538
Taal:Engels
Bindwijze:Gebonden
Aantal pagina's:264
Uitgever:CRC Press
Druk:3
Hoofdrubriek:Wetenschap en techniek, Computer en informatica
Lezersrecensies
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Inhoudsopgave
Preface; Abbreviations; 1. Microscopy with Light and Electrons 2. Electrons and Their Interaction with the Specimen 3. Electron Diffraction 4. The Transmission Electron Microscope 5. The Scanning Electron Microscope 6. Chemical Analysis in the Electron Microscope 7. Electron Microscopy and Other Techniques; Further Reading; Index
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