Otwin Breitenstein,
Wilhelm Warta,
Martin C. Schubert
Lock-in Thermography
Basics and Use for Evaluating Electronic Devices and Materials
Gebonden Engels 2019 3e druk 9783319998244Levertijd ongeveer 9 werkdagen
Gratis verzonden
Samenvatting
This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.
Specificaties
ISBN13:9783319998244
Taal:Engels
Bindwijze:gebonden
Uitgever:Springer International Publishing
Druk:3
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Inhoudsopgave
<p>Introduction.- Physical and Technical Basics.- Experimental Technique.- Theory.- Measurement Strategies.- Typical Applications.- Summary and Outlook.</p> <p> </p>
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