Youichi Murakami,
Sumio Ishihara
Resonant X-Ray Scattering in Correlated Systems
Paperback Engels 2018 9783662571224Levertijd ± 9 werkdagen
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Samenvatting
The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown.
Specificaties
ISBN13:9783662571224
Taal:Engels
Bindwijze:Paperback
Aantal pagina's:241
Uitgever:Springer Berlin Heidelberg
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Inhoudsopgave
Resonant X-ray Scattering and Orbital Degree of Freedom in Correlated Electron Systems (S. Ishihara).- Resonant X-ray scattering in 3d electron systems (H. Nakao).- Observation of multipole orderings in f-electron systems by resonant x-ray diffraction (T. Matsumura).- Hard X-ray Resonant Scattering for Studying Magnetism (T. Arima).- Resonant soft x-ray scattering studies of transition-metal oxides (H. Wadati).- Resonant inelastic x-ray scattering in strongly correlated copper oxides (K. Ishii).
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