Advances in Imaging and Electron Physics
Silicon-Based Millimetre-wave Technology
Gebonden Engels 2012 9780123942982Levertijd ongeveer 9 werkdagen
Gratis verzonden
Samenvatting
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Specificaties
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Inhoudsopgave
<ol> <li>Measurement Techniques and Practical Issues</li> <p>Jamal Deen</p> <p> <li>Transmission lines and passive components</li> <p>Guennadi A. Kouzaev</p> <p> <li>Modeling and Design of High Frequency Structures Using Artificial Neural Networks and Space Mapping</li> <p>Mohamed Bakr </p> <p> <li>Field-effect types of transistors</li> <p>Benjamin Iniguez</p> <p> <li>RF MEMS Switches and Switch Matrices</li> <p>Mojgan Daneshmand</p> <p> <li>Substrate-Integrated Antennas on Silicon</li> </ol> <p>Natalia K. Nikolova</p>
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