Peter W. Hawkes,
Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France) Hawkes
Advances in Imaging and Electron Physics
Gebonden Engels 2016 9780128048108Levertijd ongeveer 9 werkdagen
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Samenvatting
Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices, especially semiconductor devices, particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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Lezersrecensies
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Inhoudsopgave
<p>1. Direct Digital Electron DetectorsR. Clough and A.I. Kirkland2. Transmission Electron Microscopy: Emerging Investigations for Cultural Heritage MaterialsP. Sciau3. Quest for Ultimate Resolution using Coherent Electron Waves: An Aberration Corrected High-Voltage Electron MicroscopeT. Tanigaki, T. Akashi, Y. Takahashi, T. Kawasaki and H. Shinada</p>
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