J. C. Riviere,
J. C. Rivière
Surface Analytical Techniques
Gebonden Engels 1990 9780198513704Levertijd ± 11 werkdagen
Gratis verzonden
Samenvatting
Numerous techniques are available for providing detailed compositional information of the surface of materials. This volume aims to clarify those techniques which use particles as various kinds of probes for surface analysis. The techniques are grouped according to the nature of the incident radiation: electron excitation, photon excitation, ion excitation, and neutral excitation.
Specificaties
Lezersrecensies
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Inhoudsopgave
Introduction; Resumè of physical principles; Instrumentation; Electron excitation: AES and SAM; Electron excitation: ELS, CEELS, and HREELS; Electron excitation: SXAPS, AEAPS, and DAPS; Electron excitation: IPES; Electron excitation: CLS and EIL; Electron excitation: ESD and ESDIAD; Photon excitation: XPS and XAES; Photon excitation: UPS and SRPS; Photon excitation: RAIRS and SERS; Ion excitation: AES and PAES; Ion excitation: INS and MQS; Ion excitation: IBSCA and GDOS; Ion excitation: ISS; Ion excitation: SSIMS; Ion excitation: SNMS and GDMS; Neutral excitation: FABMS; High field excitation: IETS; High field excitation: APFIM; High field excitation: STM and STS; Thermal excitation: TDS.
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