Martin Hÿtch,
Peter W. Hawkes
Advances in Imaging and Electron Physics
Gebonden Engels 2022 9780323988636Levertijd ± 9 werkdagen
Gratis verzonden
Samenvatting
Advances in Imaging and Electron Physics, Volume 224 highlights new advances in the field, with this new volume presenting interesting chapters on Measuring elastic deformation and orientation gradients by scanning electron microscopy - conventional, new and emerging methods, Development of an alternative global method with high angular resolution, Implementing the new global method, Numerical validation of the method and influence of optical distortions, and Applications of the method.
Specificaties
ISBN13:9780323988636
Taal:Engels
Bindwijze:Gebonden
Aantal pagina's:266
Uitgever:Elsevier Science
Hoofdrubriek:Wetenschap en techniek, Computer en informatica
Lezersrecensies
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Inhoudsopgave
Preface
Martin Hÿtch and Peter W. Hawkes
1. Measuring elastic strains and orientation gradients by scanning electron microscopy: Conventional and emerging methods
Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy
2. Development of a global homography-based approach for high-angular resolution in the SEM
Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy
3. Implementing the homography-based global approach
Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy
4. Numerical validation and influence of optical distorsions on accuracy
Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy
5. Applications of the method
Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger,Vincent Taupin and Emmanuel Bouzy
6. Spin wave physics: The nonlinear spin wave-electromagnetic interaction and implications for high frequency devices
Clifford M. Krowne
Martin Hÿtch and Peter W. Hawkes
1. Measuring elastic strains and orientation gradients by scanning electron microscopy: Conventional and emerging methods
Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy
2. Development of a global homography-based approach for high-angular resolution in the SEM
Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy
3. Implementing the homography-based global approach
Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy
4. Numerical validation and influence of optical distorsions on accuracy
Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy
5. Applications of the method
Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger,Vincent Taupin and Emmanuel Bouzy
6. Spin wave physics: The nonlinear spin wave-electromagnetic interaction and implications for high frequency devices
Clifford M. Krowne
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