Lawrence E Murr
Electron and Ion Microscopy and Microanalysis
Principles and Applications, Second Edition,
Paperback Engels 2019 2e druk 9780367402945Levertijd ± 8 werkdagen
Gratis verzonden
Samenvatting
The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr
Specificaties
ISBN13:9780367402945
Taal:Engels
Bindwijze:Paperback
Aantal pagina's:856
Uitgever:Taylor & Francis Ltd
Druk:2
Thema:
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Inhoudsopgave
CHAPTER 1: FUNDAMENTAL PROPERTIES OF ELECTRONS AND IONS. CHAPTER 2: ELECTRON EMISSION AND EMISSION AND IONIZATION MICROSCOPY. CHAPTER. 3: ELECTRON AND ION OPTICS AND OPTICAL SYSTEMS. CHAPTER 4: ELECTRON AND ION PROBE MICROANALYSIS. CHAPTER 5: ELECTRON AND ION MICROSCOPY OF SURFACES. CHAPTER 6: ELECTRON DIFFRACTION. CHAPTER 7: TRANSMISSION ELECTRON MICROSCOPY. CHAPTER 8: HIGH-VOLTAGE ELECTRON MICROSCOPY.
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