John Humphreys,
Peter J. Goodhew,
Richard Beanland,
John Humphreys,
Peter J. Goodhew,
Richard Beanland
e.a.
Electron Microscopy and Analysis
Paperback EN 2000 3e druk 9780748409686Levertijd ongeveer 16 werkdagen
Gratis verzonden
Samenvatting
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.
Specificaties
ISBN13:9780748409686
Taal:EN
Bindwijze:Paperback
Aantal pagina's:264
Uitgever:Taylor & Francis Ltd
Druk:3
Thema:
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