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Distributed Large-Scale Dimensional Metrology

New Insights

Gebonden Engels 2011 2011e druk 9780857295422
€ 180,99
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Samenvatting

The field of large-scale dimensional metrology (LSM) deals with objects that have linear dimensions ranging from tens to hundreds of meters. It has recently attracted a great deal of interest in many areas of production, including the automotive, railway, and shipbuilding sectors.

Distributed Large-Scale Dimensional Metrology introduces a new paradigm in this field that reverses the classical metrological approach: measuring systems that are portable and can be easily moved around the location of the measured object, which is preferable to moving the object itself.

Distributed Large-Scale Dimensional Metrology combines the concepts of distributed systems and large scale metrology at the application level. It focuses on the latest insights and challenges of this new generation of systems from the perspective of the designers and developers. The main topics are:coverage of measuring area,sensors calibration,on-line diagnostics,probe management, andanalysis of metrological performance.

The general descriptions of each topic are further enriched by specific examples concerning the use of commercially available systems or the development of new prototypes. This will be particularly useful for professional practitioners such as quality engineers, manufacturing and development engineers, and procurement specialists, but Distributed Large-Scale Dimensional Metrology also has a wealth of information for interested academics.

Specificaties

ISBN13:9780857295422
Taal:Engels
Bindwijze:gebonden
Aantal pagina's:233
Uitgever:Springer London
Druk:2011

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Inhoudsopgave

1. LSM: The New Paradigm of Distributed Systems.- 2. Indoor GPS (iGPSTM).- 3. The Mobile Spatial coordinate Measuring System (MScMS).- 4. Positioning and Coverage of Distributed Devices.- 5. System Calibration.- 6. Self-Diagnostic Tools.- 7. Methodologies for Performance Enhancing.- 8. Evaluation of Measurement Uncertainty.

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€ 180,99
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        Distributed Large-Scale Dimensional Metrology