B.D. Cullity,
S.R. Stock
Elements of X-Ray Diffraction
Pearson New International Edition
Paperback Engels 2013 3e druk 9781292040547Levertijd ongeveer 9 werkdagen
Gratis verzonden
Samenvatting
Designed for Junior/Senior undergraduate courses.
This revision of a classical text is intended to acquaint the reader, who has no prior knowledge of the subject, with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The text is a collection of principles and methods designed directly for the student and not a reference tool for the advanced reader
Specificaties
ISBN13:9781292040547
Taal:Engels
Bindwijze:Paperback
Aantal pagina's:656
Uitgever:Pearson Education
Druk:3
Thema:
Lezersrecensies
Wees de eerste die een lezersrecensie schrijft!
Inhoudsopgave
1. Properties of X-rays.
2. Geometry of Crystals.
3. Diffraction I: Directions of Diffracted Beams.
4. Diffraction II: Intensities of Diffracted Beams.
5. Diffraction III: Non-Ideal Samples.
6. Laure Photographs.
7. Powder Photographs.
8. Diffractometer and Spectrometer.
9. Orientation and Quality of Single Crystals.
10. Structure of Polycrystalline Aggregates.
11. Determination of Crystal Structure.
12. Precise Parameter Measurements.
13. Phase-Diagram Determination.
14. Order-Disorder Transformation.
15. Chemical Analysis of X-ray Diffraction.
16. Chemical Analysis by X-ray Spectrometry.
17. Measurements of Residual Stress.
18. Polymers.
19. Small Angle Scatters.
20. Transmission Electron Microscope.
2. Geometry of Crystals.
3. Diffraction I: Directions of Diffracted Beams.
4. Diffraction II: Intensities of Diffracted Beams.
5. Diffraction III: Non-Ideal Samples.
6. Laure Photographs.
7. Powder Photographs.
8. Diffractometer and Spectrometer.
9. Orientation and Quality of Single Crystals.
10. Structure of Polycrystalline Aggregates.
11. Determination of Crystal Structure.
12. Precise Parameter Measurements.
13. Phase-Diagram Determination.
14. Order-Disorder Transformation.
15. Chemical Analysis of X-ray Diffraction.
16. Chemical Analysis by X-ray Spectrometry.
17. Measurements of Residual Stress.
18. Polymers.
19. Small Angle Scatters.
20. Transmission Electron Microscope.
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