Charles E. Stroud
A Designer’s Guide to Built-In Self-Test
Gebonden Engels 2002 2002e druk 9781402070501Levertijd ongeveer 9 werkdagen
Gratis verzonden
Samenvatting
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
Specificaties
ISBN13:9781402070501
Taal:Engels
Bindwijze:gebonden
Aantal pagina's:320
Uitgever:Springer US
Druk:2002
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Inhoudsopgave
Preface. About the Author. 1. An Overview of BIST. 2. Fault Models, Detection, and Simulation. 3. Design for Testability. 4. Test Pattern Generation. 5. Output Response Analysis. 6. Manufacturing and System-Level Use of BIST. 7. Built-In Logic Block Observer. 8. Pseudo-Exhaustive BIST. 9. Circular BIST. 10. Scan-Based BIST. 11. Non-Intrusive BIST. 12. BIST for Regular Structures. 13. BIST for FPGAs and CPLDs. 14. Applying Digital BIST of Mixed-Signal Systems. 15. Merging BIST and Concurrent Fault Detection. Acronyms. Bibliography. Index.
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