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Reliability of Nanoscale Circuits and Systems

Methodologies and Circuit Architectures

Gebonden Engels 2010 2011e druk 9781441962164
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Samenvatting

This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.

Specificaties

ISBN13:9781441962164
Taal:Engels
Bindwijze:gebonden
Aantal pagina's:195
Uitgever:Springer New York
Druk:2011

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Inhoudsopgave

Introduction.- Reliability, Faults and Fault Models.- Nanotechnology and Nanodevices.- Fault-Tolerant Architectures and Approaches.- Reliability Evaluation Techniques.- Averaging Design Implementations.- Statistical Evaluation of Fault-Tolerance Using Proability Density Functions.- System Level Reliability Evaluation and Optimization.- Summary and Conclusions.- References.

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€ 122,99
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          Reliability of Nanoscale Circuits and Systems