Thomas Vogt,
Wolfgang Dahmen,
Peter Binev
Modeling Nanoscale Imaging in Electron Microscopy
Gebonden Engels 2012 2012e druk 9781461421900Levertijd ongeveer 9 werkdagen
Gratis verzonden
Samenvatting
Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
Specificaties
ISBN13:9781461421900
Taal:Engels
Bindwijze:Gebonden
Aantal pagina's:182
Uitgever:Springer New York
Druk:2012
Thema:
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