R. Dean Adams
High Performance Memory Testing
Design Principles, Fault Modeling and Self-Test
Paperback Engels 2013 2003e druk 9781475784749Levertijd ongeveer 9 werkdagen
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Samenvatting
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
Specificaties
ISBN13:9781475784749
Taal:Engels
Bindwijze:Paperback
Aantal pagina's:250
Uitgever:Springer US
Druk:2003
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