Johan Liu,
Olli Salmela,
Jussi Sarkka,
James E. Morris,
Per-Erik Tegehall,
Cristina Andersson
e.a.
Reliability of Microtechnology
Interconnects, Devices and Systems
Paperback Engels 2014 9781489982117Levertijd ongeveer 9 werkdagen
Gratis verzonden
Samenvatting
Reliability of Microtechnology discusses the reliability of microtechnology products from the bottom up, beginning with devices and extending to systems. The book's focus includes but is not limited to reliability issues of interconnects, the methodology of reliability concepts and general failure mechanisms. Specific failure modes in solder and conductive adhesives are discussed at great length. Coverage of accelerated testing, component and system level reliability, and reliability design for manufacturability are also described in detail.
The book also includes exercises and detailed solutions at the end of each chapter.
Specificaties
ISBN13:9781489982117
Taal:Engels
Bindwijze:paperback
Uitgever:Springer New York
Lezersrecensies
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Inhoudsopgave
<P>Introduction to Reliability and its Importance.- Reliability Metrology.- General Failure Mechanisms of Microsystems.- Solder and Conductive Adhesive Joint Reliability.- Accelerated Testing.- Reliability Design for Manufacturability.- Component Reliability.- System Level Reliability.- Reliability and Quality Management of Microsystem.- Experimental Tools for Reliability Analysis.</P>
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