Manjul Bhushan,
Mark B. Ketchen
CMOS Test and Evaluation
A Physical Perspective
Gebonden Engels 2014 2015e druk 9781493913480Levertijd ongeveer 9 werkdagen
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Samenvatting
CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.
Specificaties
ISBN13:9781493913480
Taal:Engels
Bindwijze:gebonden
Aantal pagina's:424
Uitgever:Springer New York
Druk:2015
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Inhoudsopgave
<p>Introduction.- CMOS Circuit Basics.- CMOS Storage Elements and Synchronous Logic.- IDDQ and Power.- Embedded PVT Monitors.- Variability.- Product Chip Test and Characterization.- Reliability, Burn-In and Guardbands.- Data Analysis and Characterization.- CMOS Metrics and Model Evaluation.</p>
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