Massimo Vanzi,
Laurent Bechou,
Mitsuo Fukuda,
Giovanna Mura
e.a.
Advanced Laser Diode Reliability
Gebonden Engels 2021 9781785481543Levertijd ongeveer 9 werkdagen
Gratis verzonden
Samenvatting
Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction.
Specificaties
Lezersrecensies
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Inhoudsopgave
<p>1. Laser Diode Reliability<br>2. Multi-Component Model for Semiconductor Laser Degradation<br>3. Reliability of Laser Diodes for High-Rate Optical Communications - A Monte Carlo-Based Method to Predict Lifetime Distributions and Failure Rates in Operating Conditions<br>4. Laser Diode Characteristics<br>5. Laser Diode DC Measurement Protocols</p>
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