Jon S. Wilson,
Jon S. (Principal Consultant, The Dynamic Consultant, CA, USA) Wilson,
Stuart Ball,
Stuart (Embedded Systems consultant and author) Ball,
Creed Huddleston,
Creed (Real-Time by Design, LLC, Raleigh, NC, USA) Huddleston,
Edward Ramsden,
Edward (Senior Engineer, Lattice Semiconductor, Hillsboro, OR, USA) Ramsden,
Dogan Ibrahim,
Dogan (Department of Computer Information Systems, Near East University) Ibrahim
e.a.
Test and Measurement: Know It All
Paperback Engels 2008 9781856175302Levertijd ongeveer 9 werkdagen
Gratis verzonden
Samenvatting
The Newnes Know It All Series takes the best of what our authors have written to create hard-working desk references that will be an engineer's first port of call for key information, design techniques and rules of thumb. Guaranteed not to gather dust on a shelf!Field Application engineers need to master a wide area of topics to excel. The Test and Measurement Know It All covers every angle including Machine Vision and Inspection, Communications Testing, Compliance Testing, along with Automotive, Aerospace, and Defense testing.
Specificaties
ISBN13:9781856175302
Taal:Engels
Bindwijze:Paperback
Uitgever:Elsevier Science
Serie:Newnes Know It All
Lezersrecensies
Wees de eerste die een lezersrecensie schrijft!
Inhoudsopgave
Chapter 1 Fundamental of measurementChapter 2 Sensors and TransducersChapter 3. Data acquisition hardware and softwareChapter 4. Overview of measurement systemsChapter 5 Acceleration, Shock and VibrationChapter 6 FlowChapter 7 TemperatureChapter 8 PressureChapter 9. PositionChapter 10 Strain gauges, loadcells and weighingChapter 11 LightChapter 12 Signal Processing and ConditioningChapter 13 Interfacing and Data CommunicationsChapter 14 Data acquisition softwareChapter 15. Scaling and calibrationChapter 16. Synthetic instrumentsChapter 17 Real-world measurement applicationsChapter 18. Testing methodsChapter 19 Boundary Scan TechniquesChapter 20 Inspection TestChapter 21 EMC fundamentalsChapter 22 Measuring RF emissionsChapter 23 Test methodsChapter 24 Test planningCHAPTER 25 Accelerated testing fundamentalsChapter 26 HALT and FMVTAppendix A: Standard Interfaces
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