Metal Impurities in Silicon-Device Fabrication

Gebonden Engels 2000 2e druk 9783540642138
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This up-to-date monograph provides a thorough review of the relevant data and properties of the transition-metal impurities generated during silicon-sample and device fabrication. The different mechanisms responsible for contamination are discussed, and a survey is given of their impact on device performance. The specific properties of the main and rare impurities in silicon are examined, as well as the detection methods and requirements in modern technology. This new edition includes important recent data and many new tables.

Specificaties

ISBN13:9783540642138
Taal:Engels
Bindwijze:Gebonden
Uitgever:Springer Berlin Heidelberg
Druk:2

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          Metal Impurities in Silicon-Device Fabrication