Brent Fultz,
James Howe
Transmission Electron Microscopy and Diffractometry of Materials
Gebonden Engels 2007 3e druk 9783540738855Levertijd ongeveer 9 werkdagen
Gratis verzonden
Samenvatting
This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Specificaties
ISBN13:9783540738855
Taal:Engels
Bindwijze:Gebonden
Aantal pagina's:780
Uitgever:Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Druk:3
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Inhoudsopgave
Diffraction and the X-Ray Powder Diffractometer.- The TEM and Its Optics.- Scattering.- Inelastic Electron Scattering and Spectroscopy.- Diffraction from Crystals.- Electron Diffraction and Crystallography.- Diffraction Contrast in TEM Images.- Diffraction Lineshapes.- Patterson Functions and Diffuse Scattering.- High-Resolution TEM Imaging.- High-Resolution STEM Imaging.- Dynamical Theory.
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