Applied Scanning Probe Methods X
Biomimetics and Industrial Applications
Gebonden Engels 2008 9783540740841Samenvatting
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.
Specificaties
Lezersrecensies
Inhoudsopgave
Tianming Bao, David Fong, and Sean Hand: Automated AFM as Industrial Process Metrology for Nanoelectronic Manufacturing
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