Bharat Bhushan,
Harald Fuchs,
Satoshi Kawata
Applied Scanning Probe Methods V
Scanning Probe Microscopy Techniques
Paperback Engels 2010 9783642072116Levertijd ongeveer 9 werkdagen
Gratis verzonden
Samenvatting
The volumes V, VI and VII will examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. This is the first book summarizing the state-of-the-art of this technique. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Specificaties
ISBN13:9783642072116
Taal:Engels
Bindwijze:paperback
Aantal pagina's:344
Uitgever:Springer Berlin Heidelberg
Lezersrecensies
Wees de eerste die een lezersrecensie schrijft!
Inhoudsopgave
Integrated Cantilevers and Atomic Force Microscopes.- Electrostatic Microscanner.- Low-Noise Methods for Optical Measurements of Cantilever Deflections.- Q-controlled Dynamic Force Microscopy in Air and Liquids.- High-Frequency Dynamic Force Microscopy.- Torsional Resonance Microscopy and Its Applications.- Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy.- Combined Scanning Probe Techniques for In-Situ Electrochemical Imaging at a Nanoscale.- New AFM Developments to Study Elasticity and Adhesion at the Nanoscale.- Near-Field Raman Spectroscopy and Imaging.
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