Xiao-Feng Zhang,
Ze Zhang
Progress in Transmission Electron Microscopy 1
Concepts and Techniques
Paperback Engels 2010 9783642087172Levertijd ongeveer 9 werkdagen
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Samenvatting
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications.
Specificaties
ISBN13:9783642087172
Taal:Engels
Bindwijze:paperback
Aantal pagina's:367
Uitgever:Springer Berlin Heidelberg
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Inhoudsopgave
1 The Modern Microscope Today.- 2 The Quest for Ultra-High Resolution.- 3 Z-Contrast Imaging in the Scanning Transmission Electron Microscope.- 4 Inelastic Scattering in Electron Microscopy-Effects, Spectrometry and Imaging.- 5 Quantitative Analysis of High-Resolution Atomic Images.- 6 Electron Crystallography-Structure determination by combining HREM, Crystallographic image processing and electron diffraction.- 7 Electron Amorphography.- 8 Weak-Beam Electron Microscopy.- 9 Point Group and Space Group Identification by Convergent Beam Electron Diffraction.- 10 Advanced Techniques in TEM Specimen Preparation.
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