Yonghua Rong
Characterization of Microstructures by Analytical Electron Microscopy (AEM)
Gebonden Engels 2012 9783642201189Levertijd ongeveer 9 werkdagen
Gratis verzonden
Samenvatting
"Characterization of Microstructures by Analytical Electron Microscopy (AEM)" describes the basic concepts and operative techniques of AEM. It focuses on the study of phase transformations and dislocation in deformation by AEM. Further, the book also presents the physical concepts and mathematic analysis for diffraction and crystallography using numerous examples, such as the quantitative prediction of the orientation relationships in phase transformations. The book is intended for researchers and graduate students in materials science, engineering, and condensed matter physics. Yonghua Rong is a professor at the School of Materials Science and Engineering, Shanghai Jiao Tong University, China.
Specificaties
ISBN13:9783642201189
Taal:Engels
Bindwijze:Gebonden
Aantal pagina's:570
Uitgever:Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Lezersrecensies
Wees de eerste die een lezersrecensie schrijft!
Inhoudsopgave
The Analytical Electron Microscope (AEM).- Specimen Preparation.- Electron Diffraction.- Mathematics Analysis in Electron Diffraction and Crystallography.- Diffraction Contrast.- High Resolution and High Spatial Resolution of Analytical Electron Microscopy.
Rubrieken
- advisering
- algemeen management
- coaching en trainen
- communicatie en media
- economie
- financieel management
- inkoop en logistiek
- internet en social media
- it-management / ict
- juridisch
- leiderschap
- marketing
- mens en maatschappij
- non-profit
- ondernemen
- organisatiekunde
- personal finance
- personeelsmanagement
- persoonlijke effectiviteit
- projectmanagement
- psychologie
- reclame en verkoop
- strategisch management
- verandermanagement
- werk en loopbaan