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X-Ray Diffraction by Disordered Lamellar Structures

Theory and Applications to Microdivided Silicates and Carbons

Paperback Engels 2011 9783642748042
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New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.

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ISBN13:9783642748042
Taal:Engels
Bindwijze:Paperback
Aantal pagina's:371
Uitgever:Springer Berlin Heidelberg

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          X-Ray Diffraction by Disordered Lamellar Structures