High-Resolution Electron Microscopy for Materials Science

1. Basis of High-Resolution Electron Microscopy.- 1.1 Principles of Transmission Electron Microscopy.- 1.2 Electron Scattering and Fourier Transform.- 1.3 Formation of High-Resolution Images.- 1.3.1 High-Resolution Images of Thin Crystals.- 1.3.2 Resolution of Electron Microscopes.- 1.3.3 High-Resolution Images of Thick Crystals.- 1.4 Computer Simulation of High-Resolution Images.- 1.4.1 Simulation Program and Input Parameters.- 1.4.2 Generalization of Image Simulation.- 1.4.3 Checking Programs.- References.- 2. Practice of High-Resolution Electron Microscopy.- 2.1 Classification of High-Resolution Images.- 2.1.1 Lattice Fringes.- 2.1.2 One-Dimensional Structure Images.- 2.1.3 Two-Dimensional Lattice Images.- 2.1.4 Two-Dimensional Structure Images.- 2.1.5 Special Images.- 2.2 Practice in Observing High-Resolution Images.- 2.2.1 Points to Note Before Observation.- 2.2.2 Points to Note During Observation.- 2.2.3 Selection of Good Images.- 2.2.4 Points to Note in the Interpretation of Images.- 2.2.5 Training for the Observation of High-Resolution Images.- References.- 3. Application of High-Resolution Electron Microscopy.- 3.1 High-Resolution Images of Various Defects.- 3.1.1 Dislocations.- 3.1.2 Grain Boundaries and Interfaces Between Different Phases.- 3.1.3 Surfaces.- 3.1.4 Other Structural Defects.- 3.2 High-Resolution Images of Various Materials.- 3.2.1 Ceramics.- 3.2.2 Superconducting Oxides.- 3.2.3 Ordered Alloys.- 3.2.4 Quasicrystals.- References.- 4. Peripheral Instruments and Techniques for High-Resolution Electron Microscopy.- 4.1 Image Processing.- 4.1.1 Input and Output of High-Resolution Images.- 4.1.2 Practice in Processing High-Resolution Images.- 4.2 Quantitative Analysis.- 4.2.1 Principles of New Recording Systems.- 4.2.2 Characteristics of New Recording Systems.- 4.2.3 Quantitative High-Resolution Electron Microscopy.- 4.3 Electron Diffraction.- 4.3.1 Basis of Electron Diffraction.- 4.3.2 Practice of Electron Diffraction.- 4.3.3 Electron Diffraction Patterns of Various Structures.- 4.4 Weak-Beam Method.- 4.4.1 Principles of the Weak-Beam Method.- 4.4.2 Weak-Beam Method in Practice.- 4.5 Evaluation of the Performance of Electron Microscopes.- 4.5.1 Evaluation of Basic Parameters in Electron Microscopes.- 4.5.2 Evaluation of the Resolution of Electron Microscopes.- 4.6 Specimen Preparation Techniques.- 4.6.1 Crushing.- 4.6.2 Electropolishing.- 4.6.3 Chemical Polishing.- 4.6.4 Ultramicrotomy.- 4.6.5 Ion Milling.- 4.6.6 Focused Ion Beam (FIB).- 4.6.7 Vacuum Evaporation.- References.- Appendixes.- Appendix A. Physical Constants, Conversion Factors and Electron Wavelength.- Appendix B. Geometry of Crystal Lattice.- Appendix C. Typical Structures in Materials and Their Electron Diffraction Patterns.- Appendix D. Properties of Fourier Transform.- Appendix E. Sign Conventions.